主な研究内容

通信端末 スマートデバイス研究部
CMOS-MEMS集積化技術  >関連情報
CMOS-MEMS集積化技術
 
関連情報
 
国際会議
  • T. Sakata et al., "High-Aspect-Ratio Gold Electrodes Fabricated by Thick-Multilevel Interconnection Technology for Electrical Isolation of MEMS Mirrors in Wavelength-Selective Switches," LEOS, pp. 579-580 (2009)
  • N. Sato et al., "Energy Harvesting by MEMS Vibrational Devices with Electrets," Transducers, pp. 513-516 (2009)
  • T. Sakata et al., "Cleaning of Gold Interconnection Surface by Low-Temperature Hydrogen Annealing for MEMS Device Fabrication," ECS, 3162 (2008)
  • H. Morimura et al., "Integrated CMOS-MEMS technology and its applications," ICSICT, pp. 2460-2463 (2008)
  • K. Kuwabara et al., "Method for Extracting RF Characteristics of CMOS-MEMS Inductors," SSDM, 5267 (2008)
 
論文
  • N. Shimoyama et al., "The Effect of Thick Interconnection Formed by Gold Electroplating on the Characteristics of Metal-Oxide-Semiconductor Field-Effect Transistors," Jpn. J. Appl. Phys.,vol. 49, 016501 (2010)
  • T. Sakata et al., "Surface Cleaning of Gold Structure by Annealing during Fabrication of Microelectromechanical System Devices," Jpn. J. Appl. Phys., vol. 48, 026501 (2009)
 
解説記事
  • Y. Sato, "ユビキタスサービス社会を支えるMEMSデバイス技術," 月刊ディスプレイ,2010年1月号, p. 46 (2010)
  • H.Morimura, "集積化CMOS−MEMS技術," 電子情報通信学会誌, 2009年1月, pp. 26-30 (2009)
  • K. Kuwabara, "RF MEMSデバイス," MEMSデバイス総論 (2009)
  • N. Sato, "MEMSデバイスの3次元構造封止のためのSTP技術とその応用," マテリアルステージ (2008)
  • H. Ishii, "Electrodeposition of organic thin films for preventing sticking in MEMS devices," Material Stage, 2008年12月 (2008)
 
 
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