Top > Profile > History/Achievement > 1976-1988

1976-1988
| 1976 |
- [ Establishment of Large Scale Integrated Memory Division ]
- Corroboration of Long Wave Length Band Optical
|
| 1977 |
- Fabrication of a 64 kbit Memory (DRAM)
- Fabrication of Optical Fiber by Vapor-phase Axial Deposition
|
| 1978 |
- Invention of SIMOX Technology
|
| 1979 |
- Development of a Single-chip LSI for PARCOR Speech Synthesis
- Fabrication of a 256 kbit Memory (DRAM)
- Development of 0.2 dB/km very low loss Optical Fiber
|
| 1980 |
- Development of Super-High-Purity Optical Fiber
- Invention of Master Key Method of Public Key Cryptosystem
- Sustained Room Temperature Operation of 1.55 µm Semiconductor Laser
|
| 1981 |
- Fabrication of CMOS 32 Bit VLSI Processor
* Sustained Room Temperature Operation of DFB Laser
|
| 1982 |
- [ Establishment of Functional Device Research Department ]
- Measurement of Soliton transmission on Joseffson transmission line
- Fabrication of 1 Mbit Memory (DRAM)
- Fabrication of Gallium Arsenide 1Kbit LSI Memory
|
| 1983 |
- [ Establishment of Atsugi Electrical Communications Laboratories ]
|
| 1984 |
- [ Establishment of Information Communications and Materials science basic Research Department ]
- Achievement of a dislocation-free 2inch Gallium Arsenide Crystal
|
| 1985 |
- [ Privatization, the Birth of Nippon Telegraph and Telephone Corporation ]
- [ Establishment of Basic Research Laboratories ]
- Invention of Migration Enhanced Epitaxy (MEE)
|
| 1986 |
- Development of High-Speed Fabrication of Single-mode Optical Fiber using the Full VAD Synthesis Process
- Invention of Phonocode Speech Encoding Method
- Development of Travelling Wave Semiconductor Optical Amplifier
- Invention of 1.5µm band Zero Dispersion Fiber
- Development of Planar Light Wave Circuit (PLC) Design and Fabrication Technology
- Development of DS Type Optical Connectors
|
| 1987 |
- [ Establishment of LSI Laboratories, and Opto-electronics Laboratories ]
- Development of Ballistic Carrier Transistor (BCT)
- Fabrication of 16 Mbit Level DRAM TEST Devices
- Fabrication of Oxide Superconductor Thin Films
- Generation of Amplitude Squeezed Light in Semiconductor Lasers
- Successful control of Neurite Growth Orientation
- Successful Emission of SOR Light
|
| 1988 |
- Development of High Speed LSI Probing Technology (EOS)
- Fabrication of Narrow Spectrum Line Width Multi-electrode DFB Laser
- Practical Use of SC Type Optical Connectors
|